PLANT DISEASE AND CONTROL
ZENG Qing-dong, SHEN Chuan,YUAN Feng-ping,WANG Qi-Lin,WU Jian-Hui,XUE Wen-Bo,ZHAN Gang-Ming,YAO Shi,CHEN Wei,HUANG Li-Li, HAN De-Jun, KANG Zhen-Sheng
Wheat stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive diseases of wheat in China. To evaluate which resistance genes are still effective to the prevalent pathotypes and to provide the theoretical basis for predictive resistant stripe rust-breeding, we evaluated 73 cultivars with known Yr gene(s) for reaction to the main prevalent stripe rust pathotypes CYR32, CYR33 (Su11-14-3) and isolate V26/CM42 (Pingnan17-5) separately in both the seedling stage and the field test in Yangling and Tianshui. The result showed that the single gene Yr1,Yr2, Yr6, Yr7, Yr8, Yr17, Yr18, Yr21, Yr27, Yr28, Yr29, Yr31, Yr36, Yr39, Yr41, Yr43, Yr44, YrA, YrExp2, YrSP and the Yr-gene combinations in the cultivar Joss Combier, Heines Ⅶ, Heines Peko, Strubes Dikkopf, Capelle Desprez, Stephens, Fielder, Heinese Kolben, Clement, Paha were susceptible in all of the tests, indicating that the genes or gene combinations cannot be used in the practice anymore. The genes Yr10, Yr24 and Yr26 confer race-specific all-stage resistance and are still effective against CYR32 and CYR33 but becoming ineffective to isolate V26/CM42, suggesting that these three genes also cannot be used in the future. Among all the tested single Yr-genes, only genes Yr5, Yr15 and Yr61 had all-stage resistance (ASR) in all the tests, and genes Yr32、YrTr1 and YrTye were resistant in all the field tests in adult stage, but susceptible in at least one test in the seedling stage. These genes showed adult-plant resistance (APR). Nine cultivars carrying multigene, i.e., Mega, Ibis, Hyak, Maris Huntsman, Hobbit, Carstens V, Express, Lee and Compair also showed APR in this study.